Happy About Global Software Test Automation: A Discussion of Software Testing for Executives
Hung Q. Nguyen,Michael Hackett,Brent K. Whitlock
Hung Q. Nguyen,Michael Hackett,Brent K. Whitlock
Jim Woodcock,Victor Bandur (auth.),Burkhart Wolff,Marie-Claude Gaudel,Abderrahmane Feliachi (eds.)
Radu Sion (editor),Reza Curtmola (editor),Sven Dietrich (editor),Aggelos Kiayias (editor),Josep M Miret (editor),Kazue Sako (editor),Francesc Sebé (editor)
Thomas W Pearson
Catherine M. Otto MD FACC FAHA,Robert O. Bonow MD MS MACC FAHA
Franz Gross
Mahan Khalsa;Randy Illig;Stephen R. Covey
Birsel,Ayse
Philip Price
Øyvind Grøn (auth.)
Peter van Sommers
William T. Ziemba,Leonard C. MacLean (auth.),Marida Bertocchi,Giorgio Consigli,Michael A. H. Dempster (eds.)
Judith E. Tintinalli,J. Stephan Stapczynski,O. John Ma,David M. Cline,Garth D. Meckler,Donald M. Yealy
Jan Schaffner (auth.)
Sergej Rjasanow;Olaf Steinbach
Apeldoorn, Bastiaan van;Graaff, Nana De
R B Bapat;et al (eds.)
Eric R. Johnston,Nic Harrigan,Mercedes Gimeno-Segovia
Stephen Denning
Hong Wei Xiang
Adler, Irving;Hess, Lowell
Márcia Cristina Breitkreitz (editor),Hector Goicoechea (editor)
Benedict Bender
David Tall,Ian Stewart
Timo Aho,Tapio Elomaa,Jussi Kujala (auth.),Catherine C. McGeoch (eds.)
Jeffrey E.F. Friedl
Joshua Rosenbaum,Joshua Pearl,Joseph R. Perella
Sunil R. Lakhani;Caroline Finlayson;Susan A. Dilly;Mitesh Gandhi
Avishai Sadan
Carlos Aguilar Melchor,Pierre-Louis Cayrel,Philippe Gaborit (auth.),Johannes Buchmann,Jintai Ding (eds.)
David Phillips,Philip Young