Probability, Statistics, and Reliability for Engineers and Scientists
Ayyub, Bilal M.;McCuen, Richard H.
Ayyub, Bilal M.;McCuen, Richard H.
Alessandro Innocenti;Angela Sirigu
Richard Wall,David Shearer(auth.)
Parvaneh Joharinad,Jürgen Jost
Glen Doyle,Elvis Stojko,Bruce Burton
Steven J. Brams,Alan D. Taylor
Tom M. Apostol (auth.)
Akhilesh Bajaj,Akhilesh Bajaj,Stanislaw Wrycza
Hakeem Oluseyi;Joshua Horwitz
Scott Watson
Raj Kumar Sharma B Tech IIT ( ISM ) Dhanbad
Reza Ardehali,Marco Perez,Paul Wang
Shelton,Tiffany
Robert J. Goldston,Paul H. Rutherford
Amy Cuddy
Cornier, Jean;Kwade, Arno;Owen, Andrew;Voorde, Marcel H
Sam Calagione
Richard P. Haynes
Jorgen Hesselberg
Pulizzi,Joe
Amarnag Subramanya,Partha Pratim Talukdar
Canuto S.,Sabin J.R. (eds.)
L. Comtet
Daniel G. Quillen
Giuseppe Liotta,Roberto Tamassia,Ioannis G. Tollis
Rockridge Press