Robust Network Compressive Sensing
Guangtao Xue,Yi-Chao Chen,Feng Lyu,Minglu Li
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Applied Mathematics is a pivotal discipline that uses mathematical techniques and tools to solve real-world problems. It bridges the gap between theoretical mathematics and practical applications in science, engineering, and industry. In our online bookstore, Refhub.ir, you will find a wide array of books that cover the diverse realms of applied mathematics, from introductory texts to advanced treatises.
Applied Mathematics is essential for modeling and solving problems in various fields, including physics, biology, economics, and engineering. Its techniques are indispensable for designing algorithms, optimizing processes, and understanding complex systems. This category encompasses topics like differential equations, numerical analysis, statistical methods, and data science, making it a cornerstone for innovation and development.
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Guangtao Xue,Yi-Chao Chen,Feng Lyu,Minglu Li
Trevor Hastie,Robert Tibshirani,Jerome Friedman
J. Kevorkian,J. D. Cole (auth.)
Tatjana Eitrich; Bruno Lang
Chen, Zheshi; Li, Chunhong; Sun, Wenjun
Herbert Callen
Steven L. Brunton,J. Nathan Kutz
Ayyub, Bilal M.;McCuen, Richard H.
Ronald E. Walpole,Raymond H. Myers,Sharon L. Myers,Keying E. Ye
Joel H. Ferziger,Milovan Peric
Thomas Bartz-Beielstein,Marco Chiarandini (auth.),Thomas Bartz-Beielstein,Marco Chiarandini,Luís Paquete,Mike Preuss (eds.)
LYE, KJETIL O.; MISHRA, SIDDHARTHA; MOLINARO, ROBERTO
Gerardo Chowell,Fred Brauer (auth.),Dr. Gerardo Chowell,Dr. James M. Hyman,Dr. Luís M. A. Bettencourt,Carlos Castillo-Chavez (eds.)
Raina RobevaandTerrell Hodge (Eds.)
Stephen Boyd,Lieven Vandenberghe
Grigoris Pavliotis,Andrew Stuart
Akinyelu, Andronicus A.; Adewumi, Aderemi O.
M. López; J. Martínez; J.M. Matías; J. Taboada; J.A. Vilán
Howard E.A. Tinsley,Steven D. Brown
Linghe Kong,Bowen Wang,Guihai Chen
Chen, Ting-Hsuan; Chang, Rong-Cih
Richard A. Johnson,Dean W. Wichern
Wayne Erdman,Jeff Irvine Barbara Canton
M. López; J. Martínez; J.M. Matías; J. Taboada; J.A. Vilán
Ross A. Maller;Xian Zhou
Ivo M. Foppa