
IEEE Industrial Electronics Magazine
Palensky, Peter; Van Der Meer, Arjen A.; Lopez, Claudio David; Joseph, Arun; Pan, Kaikai
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Palensky, Peter; Van Der Meer, Arjen A.; Lopez, Claudio David; Joseph, Arun; Pan, Kaikai

Palensky, Peter; Van Der Meer, Arjen A.; Lopez, Claudio David; Joseph, Arun; Pan, Kaikai


Wellman, M.P.; Wurman, P.R.; O'Malley, K.; Bangera, R.; Lin, S.-d.; Reeves, D.; Walsh, W.E.
Wang, Yunpeng; Saad, Walid; Han, Zhu; Poor, H. Vincent; Basar, Tamer
Pilz, Matthias; Al-Fagih, Luluwah

Tushar, Wayes; Yuen, Chau; Mohsenian-Rad, Hamed; Saha, Tapan; Poor, H. Vincent; Wood, Kristin L.



Liu, Siyuan; Qu, Qiang; Chen, Lei; Ni, Lionel

Qiu, Shuo; Wang, Boyang; Li, Ming; Liu, Jiqiang; Shi, Yanfeng

Liu, Yining; Guo, Wei; Fan, Chun-I.; Chang, Liang; Cheng, Chi

Journeaux, Antoine Alexandre; Bouillault, Frederic; Roger, Jean Yves

Li, J.; Singhal, S.; Swaminathan, R.; Karp, A. H.

Li, J.; Singhal, S.; Swaminathan, R.; Karp, A. H.

Zhang, Yahui; Gao, Jinwu; Shen, Tielong

Journeaux, Antoine Alexandre; Bouillault, Frederic; Roger, Jean Yves

Caino-Lores, Silvina; Carretero, Jesus; Nicolae, Bogdan; Yildiz, Orcun; Peterka, Tom

Caino-Lores, Silvina; Carretero, Jesus; Nicolae, Bogdan; Yildiz, Orcun; Peterka, Tom


Palviainen, Marko; Harviainen, Tatu; Lopez, Miguel Bordallo; Mantyjarvi, Jani

Yazici, H.; Benjamin, C.; McGlaughlin, J.


