The Wide Lens: What Successful Innovators See That Others Miss
Ron Adner
کشف منابع
Ron Adner
Banks Sh. (Ed),Hodgson V. E. (Ed),McConnell D. (Ed)
Erik Brynjolfsson,Andrew McAfee,Jeff Cummings
Strauss S.D.
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Marc Wissenburg
Leslie Haddon,Enid Mante,Bartolomeo Sapio,Kari-Hans Kommonen,Leopoldina Fortunati,Annevi Kant
Heinrich von Pierer
Leslie Haddon,Enid Mante,Bartolomeo Sapio,Kari-Hans Kommonen,Leopoldina Fortunati,Annevi Kant (eds.)
Donald L. Luskin,Andrew Greta
Konstantin Wellner (auth.)
National Research Council (U. S.)
Panel on Manufacturing Process Controls,Committee on Industrial Technology Assessments,Commission
Jean-Pierre Dal Pont,Catherine Azzaro-Pantel
Mayank Kejriwal
Madhura Yadav;Sampath Kumar
Freada Kapor Klein,Mitchell Kapor
Robert J. Shiller
Darek Klonowski
Danilo Piaggesi (editor),Helena Landazuri (editor),Bo Jia (editor)
Earll Murman,Thomas Allen,Kirkor Bozdogan,Joel Cutcher-Gershenfeld,Hugh McManus,Deborah Nightin
Robert Dirgo
Alexander C. Tsigkas (auth.)
Robert Peters
Jeff Gothelf,Josh Seiden
Kurokawa,Toshiaki
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Mario A. Pfannstiel,Christoph Rasche
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Thomas Lockwood
Christian Kraft
Butler, Jill;Lidwell, William;Holden, Kritina
William Lidwell
Scott Doorley,Scott Witthoft,Hasso Plattner Institute of Design at Stanford University,David Kelley
Norbert Fürstenau (eds.)
Norbert Fürstenau