Software Testing Techniques: Finding the Defects that Matter
Scott Loveland,Geoffrey Miller,Prewitt Jr.,Richard,Michael Shannon
Discover references
Scott Loveland,Geoffrey Miller,Prewitt Jr.,Richard,Michael Shannon
Uwe Steinmueller;Jürgen Gulbins
Robyn Brandenburg,Jacqueline Z. Wilson (auth.)
R. Rubino;L. Sepe;A. Dimitriadou;A. Gibon
Karen Chandler
Panel on Manufacturing Process Controls,Committee on Industrial Technology Assessments,Commission
Karla Johnstone,Audrey Gramling,Larry E. Rittenberg
RALF BIERIG,STEPHEN BROWN,EDGAR GALVÁN,JOE TIMONEY
Herbert Lieberman,Leon Lachman,Joseph B. Schwartz
Augsburger, Larry L.;Hoag, Stephen W
Márcia Cristina Breitkreitz (editor),Hector Goicoechea (editor)
David G. Watson
Lena Ohannesian,Anthony Streeter
Jack E. Olson
Sagar Naik,Piyu Tripathy
Ronald Mascitelli
Carlo Batini,Monica Scannapieco
Alexander Tarlinder
Rick Lutowski
Pete Sawyer,Barbara Paech,Patrick Heymans (auth.),Pete Sawyer,Barbara Paech,Patrick Heymans (eds.)
Barbara Paech,Colette Rolland (auth.),Barbara Paech,Colette Rolland (eds.)
Gayathri Mohan
Panagiotis Sfetsos, Panagiotis Sfetsos;Pagagiotis Sfetsos
Capers Jones
Alessio Ferrari (editor),Birgit Penzenstadler (editor)
Robert Hawker
Meng, Haining; Hei, Xinhong; Zhang, Jiulong; Liu, Jianjun; Sui, Liansheng

Sun, Xiang Dong; Lan, Yu; Shi, Dan; Lu, Shu Wen; Liao, Hui; Zhang, Rui Ying; Yao, Xin Miao; Zhang, Ying Lei;[...]Su, Ping; Shan, Hong

Laeequddin, Mohammed; Sahay, B.S.; Sahay, Vinita; Abdul Waheed, K.
