Electron Microscopy. Principles and Fundamentals
S. Amelinckx, et al.
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S. Amelinckx, et al.
Than Merrill
Adam Morgan
Nancy Goldstone
Nathan A. Curtis
Mlodinow,L.
A. Nejat Ince,Dag Wilhelmsen,Bülent Sankur (auth.)
Donald F. Blumberg
D. Kimbrough Oller,Ulrike Griebel
Michael Meyers
Steve Hoberman
Junji Miyakoshi (auth.),James C. Lin (eds.)
David P. Landau,Steven P. Lewis,Heinz-Bernd Schüttler
Doug Hudgeon,Richard Nichol
Douglas C. Montgomery,Cheryl L. Jennings,Murat Kulahci
Ai‐Hinnawi, M F; Barbenel, J; Ai‐Qurainy, I A; Dutton, G N
Keith McMahon
Barnhisel,Greg
Ujjwal Sahay
Gillies,Douglas Angus
Mark C. Baker,Mark Baker
J. David Logan
Scott Rieckens
Christophe Wiart
Ernst Haenchen
Posta,Christian
M.Y. Huang; Y.J. Lin; H. Xu