Applied Business Analytics: Integrating Business Process, Big Data, and Advanced Analytics
Lin N.
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In today's data-driven world, the term "Business Intelligence" (BI) is more relevant than ever. This category is dedicated to literature that explores the methodologies, technologies, and practices involved in making data-driven decisions effectively in any organization.
Business Intelligence refers to the strategies and technologies used by enterprises for the data analysis of business information. It encompasses a variety of tools, applications, and methodologies that enable organizations to collect data from internal systems and external sources, prepare it for analysis, develop and run queries against the data, and create reports, dashboards, and data visualizations to make the analytical results available to corporate decision-makers.
BI technologies can handle large amounts of structured and sometimes unstructured data to help identify, develop, and create new strategic business opportunities. The goal is to allow easy interpretation of these big data, identifying new opportunities, and implementing effective strategies based on insights can provide businesses with a competitive market advantage and long-term stability.
Key components of Business Intelligence include:
BI products can help an organization:
As technologies and business landscapes evolve, so do Business Intelligence solutions. Some emerging trends in BI include:
The Business Intelligence category in our online bookstore offers a vast collection of books and resources for both beginners and seasoned professionals in the field. These books provide detailed insights into various BI tools and technologies, case studies, implementations tips, and strategic guidance on making data a cornerstone of your business strategy.
Whether you're just starting out or looking to update your skills, there's a wealth of knowledge waiting for you to explore. Dive into our selection to find the best practices, expert advice, and real-world applications of Business Intelligence.
Lin N.
Devin Knight;Erin Ostrowsky;Mitchell Pearson;Bradley Schacht;
Thomas H. Davenport,Jinho Kim
Herbert A. Edelstein
Edward R. Tufte
John S. Hammond,Ralph L. Keeney,Howard Raiffa
patricia B. Cerrito
Orrin Edenfield, Edward Corcoran
W.H. Inmon;Daniel Linstedt;Mary Levins
John Paul Mueller,Luca Massaron
Kimball, Ralph;Mundy, Joy;Thornthwaite, Warren
Baesens, Bart;Bravo, Cristián;Verbeke, Wouter
Gildan Media.;Menasche, Steven;Siegel, Eric
Teo Lachev;Edward Price;Jen Underwood
Amy Affelt
Jiawei Han,Micheline Kamber,Jian Pei
W.H. Inmon,Dan Linstedt
Chinmay Chakraborty (editor),Jerry Chun-Wei Lin (editor),Mamoun Alazab (editor)
Jiawei Han,Micheline Kamber
John F. Tanner Jr
Institute of ElectricalandElectronics Engineers
Elizabeth Keathley
Rui Sarmento,Vera Costa
Jiawei Han,Micheline Kamber,Jian Pei
Amy Affelt,Thomas H. Davenport
David S. Williams
Martin Lindstrom
Michael L. George;John Maxey;Mark Price;Kimberly Watson-Hemphill;Paul Jaminet;David Rowlands;Chuck Cox
Yau Nathan.
Noureddine Mouaddib,Guillaume Raschia (auth.),Yahiko Kambayashi,Dik-Lun Lee,Ee-peng Lim,Mukesh Mohania,Yoshifumi Masunaga (eds.)
Carl Anderson
Erin Ostrowsky; Mitchell Pearson; Devin Knight; Bradley Schacht;
Wayne W. Eckerson
Greg Deckler
Michael Barrow