MRI: basic principles and applications
Mark A. Brown,Richard C. Semelka
Discover references
Mark A. Brown,Richard C. Semelka
Debabrata Mukherjee,Sanjay Rajagopalan
Torsten B. Moller,Emil Reif
Hans-Joachim Kretschmann,Wolfgang Weinrich
Neil M. Borden,Scott E. Forseen,Cristian Stefan
Günther Schneider,Luigi Grazioli,Sanjay Saini,D.R. Martin,L. Olivetti,A. Luca,M. Kirchin,A. Massmann,R. Seidel,L. Romanini,P. Fries,M.P. Bondioni,K. Altmeyer,M. Harisinghani,R.V. D'Souza,D. Sahani
P. Beauvais; C. Fauré; J.-P. Montagne; P. L. Chigot; P. Maroteaux
P. Beauvais; C. Fauré; J.-P. Montagne; P. L. Chigot; P. Maroteaux
M. Panuel; F. Ternier; G. Michel; S. Scheiner; B. Bourliere; F. Faure; J. M. Guys; P. Devred

Johnson, C. Daniel; Miranda, Rafael; Aakre, Kenneth T.; Roberts, Catherine C.; Patel, Maitray D.; Krecke, Karl N.

Ohno, Yoshiharu; Kauczor, Hans-Ulrich; Hatabu, Hiroto; Seo, Joon Beom; van Beek, Edwin J.R.

Lotte F. Van Dillen; Dirk J. Heslenfeld; Sander L. Koole

Van Dillen, Lotte F.; Heslenfeld, Dirk J.; Koole, Sander L.

Lotte F. Van Dillen; Dirk J. Heslenfeld; Sander L. Koole

Van Dillen, Lotte F.; Heslenfeld, Dirk J.; Koole, Sander L.